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Data integrity partially depends on the ability of the processing
electronics to detect and reject piled-up pulses. This is most evident
when working at high count rates, where triggering circuits that
rely on low-pass filtering tend to fail. The result is a combination
of degraded energy resolution, creeping background levels and anomalous
peaks.
The DXP's inherent performance at high rates has recently
been further improved with new pileup inspection algorithms
The data in figure 2. was collected at maximum throughput
(63% dead time), using an HPGe Iglet detector from Ortec and the
DXP Saturn digital x-ray spectrometer
running both the old (revision G, red)
and new (revision J, blue) filtering
algorithms. Note the dramatic improvement in pileup rejection
evidenced by lower background levels and smaller pileup peaks.
Note also the improved efficiency below 1keV due to the new trigger
algorithm.
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